분석기기특론
- 고려대학교
- Urszula Dettaff-Weglikowska
페이스북
트위터
카카오톡
네이버밴드
링크복사
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- 주제분류
- 공학 >전기ㆍ전자 >전기전자공학
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- 등록일자
- 2009.09.23
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- 조회수
- 9,169
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This course discusses on these topics: Introduction to TEM; High Resolution Transmission Electron Microscopy HRTEM; Scanning Electron Microscopy; Structure Analysis by use of X-rays; Application of UV and visible light for analysis; UV and visible light as spectroscopic analysis techniques; Optical emission as analytic tool; X-ray Photoelectron Spectroscopy (XPS) Electron Energy Loss Spectroscopy (EELS); Scanning Probe Microscopy Scanning Tunneling Microscopy, STM Atomic Force Microscopy, AFM; Analysis of magnetic properties of materials;
차시별 강의
| 1. | |
Introduction | 나노특성, 용어, 에너지 단위 |  |
| 2. | |
Introduction to TEM | This lecture identifies the history of TEM and examines the materials and tools releated to TEM. | |
| 3. | |
High Resolution Transmission Electron Microscopy HRTEM | This lecture identifies the features of advanced HRTEM and its principles. | |
| 4. | |
Scanning Electron Microscopy | This lecture examines the principles of SEM and the procedures of its utilization in matter analysis. | |
| 5. | |
Structure Analysis by use of X-rays | This lecture refers to the X-ray diffraction in order to identify the spectroscopic methods of measurement. | |
| 6. | |
Application of UV and visible light for analysis | This lecture refers to the UV and visible light in order to identify the spectroscopic methods of measurement. | |
| 7. | |
UV and visible light as spectroscopic analysis techniques | UV and visible light as spectroscopic analysis techniques | |
| 8. | |
Optical emission as analytic tool | This lecture identifies various types of emission spectroscopy and classifies them according to their procedures. | |
| 9. | |
X-ray PhotoelectronSpectroscopy (XPS) Electron Energy Loss Spectroscopy (EELS) | This lecture introduces various structure analysis methods related to spectroscopic anlysis. | |
| 10. | |
Scanning Probe Microscopy Scanning Tunneling Microscopy, STM Atomic Force Microscopy, AFM | This lecture identifies the principles and the application of STM(Scanning Tunneling Microscopy) and AFM(Atomic Force Microscopy) to nanocharacterization. | |
| 11. | |
Analysis of magnetic properties of materials | Origin of magnetism Electron magnetic moment Electron configurations in magnetic atoms Nuclear magnetic moment Structural analysis by use of NMR |
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| 12. | |
Topics for final exam and semester review | This material is the topic preparation for the final term exam. | |
연관 자료
