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Introduction | 나노특성, 용어, 에너지 단위 | ![]() |
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Introduction to TEM | This lecture identifies the history of TEM and examines the materials and tools releated to TEM. | ![]() |
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High Resolution Transmission Electron Microscopy HRTEM | This lecture identifies the features of advanced HRTEM and its principles. | ![]() |
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Scanning Electron Microscopy | This lecture examines the principles of SEM and the procedures of its utilization in matter analysis. | ![]() |
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Structure Analysis by use of X-rays | This lecture refers to the X-ray diffraction in order to identify the spectroscopic methods of measurement. | ![]() |
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Application of UV and visible light for analysis | This lecture refers to the UV and visible light in order to identify the spectroscopic methods of measurement. | ![]() |
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UV and visible light as spectroscopic analysis techniques | UV and visible light as spectroscopic analysis techniques | ![]() |
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Optical emission as analytic tool | This lecture identifies various types of emission spectroscopy and classifies them according to their procedures. | ![]() |
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X-ray PhotoelectronSpectroscopy (XPS) Electron Energy Loss Spectroscopy (EELS) | This lecture introduces various structure analysis methods related to spectroscopic anlysis. | ![]() |
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Scanning Probe Microscopy Scanning Tunneling Microscopy, STM Atomic Force Microscopy, AFM | This lecture identifies the principles and the application of STM(Scanning Tunneling Microscopy) and AFM(Atomic Force Microscopy) to nanocharacterization. | ![]() |
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Analysis of magnetic properties of materials | Origin of magnetism Electron magnetic moment Electron configurations in magnetic atoms Nuclear magnetic moment Structural analysis by use of NMR |
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Topics for final exam and semester review | This material is the topic preparation for the final term exam. | ![]() |