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분석기기특론

  • 고려대학교
  • Urszula Dettaff-Weglikowska
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  • 주제분류
    공학 >전기ㆍ전자 >전기전자공학
  • 등록일자
    2009.09.23
  • 조회수
    4,352
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This course discusses on these topics: Introduction to TEM; High Resolution Transmission Electron Microscopy HRTEM; Scanning Electron Microscopy; Structure Analysis by use of X-rays; Application of UV and visible light for analysis; UV and visible light as spectroscopic analysis techniques; Optical emission as analytic tool; X-ray Photoelectron Spectroscopy (XPS) Electron Energy Loss Spectroscopy (EELS); Scanning Probe Microscopy Scanning Tunneling Microscopy, STM Atomic Force Microscopy, AFM; Analysis of magnetic properties of materials;

차시별 강의

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1. Introduction 나노특성, 용어, 에너지 단위 URL
2. Introduction to TEM This lecture identifies the history of TEM and examines the materials and tools releated to TEM. URL
3. High Resolution Transmission Electron Microscopy HRTEM This lecture identifies the features of advanced HRTEM and its principles. URL
4. Scanning Electron Microscopy This lecture examines the principles of SEM and the procedures of its utilization in matter analysis. URL
5. Structure Analysis by use of X-rays This lecture refers to the X-ray diffraction in order to identify the spectroscopic methods of measurement. URL
6. Application of UV and visible light for analysis This lecture refers to the UV and visible light in order to identify the spectroscopic methods of measurement. URL
7. UV and visible light as spectroscopic analysis techniques UV and visible light as spectroscopic analysis techniques URL
8. Optical emission as analytic tool This lecture identifies various types of emission spectroscopy and classifies them according to their procedures. URL
9. X-ray PhotoelectronSpectroscopy (XPS) Electron Energy Loss Spectroscopy (EELS) This lecture introduces various structure analysis methods related to spectroscopic anlysis. URL
10. Scanning Probe Microscopy Scanning Tunneling Microscopy, STM Atomic Force Microscopy, AFM This lecture identifies the principles and the application of STM(Scanning Tunneling Microscopy) and AFM(Atomic Force Microscopy) to nanocharacterization. URL
11. Analysis of magnetic properties of materials Origin of magnetism
Electron magnetic moment
Electron configurations in magnetic atoms
Nuclear magnetic moment
Structural analysis by use of NMR
URL
12. Topics for final exam and semester review This material is the topic preparation for the final term exam. URL

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