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- 주제분류
- 자연과학 >수학ㆍ물리ㆍ천문ㆍ지리 >물리학
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- 강의학기
- 2013년 1학기
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- 조회수
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나노소자 구조의 고안, 소재 처리, 제조 공정, 특성 분석, 집적화 방법 등을 가르친다. 특히, 최근에
제안된 나노구조 신소자 모듈의 집적화 공정이 발전해 온 과정을 다룬다.
제안된 나노구조 신소자 모듈의 집적화 공정이 발전해 온 과정을 다룬다.
- 수강안내 및 수강신청
- ※ 수강확인증 발급을 위해서는 수강신청이 필요합니다
차시별 강의
| 1. | ![]() |
Energy band theory in solids | electron & hole of semiconductor, energy band diagram, density of states, intrinsic carrier concentrations, impurity semiconductors | |
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Energy band theory in solids | electron & hole of semiconductor, energy band diagram, density of states, intrinsic carrier concentrations, impurity semiconductors | |
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Energy band theory in solids | electron & hole of semiconductor, energy band diagram, density of states, intrinsic carrier concentrations, impurity semiconductors | |
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Energy band theory in solids | electron & hole of semiconductor, energy band diagram, density of states, intrinsic carrier concentrations, impurity semiconductors | |
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| 2. | ![]() |
Electrical properties of semiocnductors | deduction method of carrier in the real semiconductor, drift and diffusion currents, life time of minority carriers, continuity equation | |
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Electrical properties of semiocnductors | deduction method of carrier in the real semiconductor, drift and diffusion currents, life time of minority carriers, continuity equation | |
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Electrical properties of semiocnductors | deduction method of carrier in the real semiconductor, drift and diffusion currents, life time of minority carriers, continuity equation | |
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Electrical properties of semiocnductors | deduction method of carrier in the real semiconductor, drift and diffusion currents, life time of minority carriers, continuity equation | |
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| 3. | ![]() |
Current-voltage characteristics of pn junctions | built-in potential, diffusion theory, forward- and backward-bias conditions, depletion layer | |
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Current-voltage characteristics of pn junctions | built-in potential, diffusion theory, forward- and backward-bias conditions, depletion layer | |
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Current-voltage characteristics of pn junctions | built-in potential, diffusion theory, forward- and backward-bias conditions, depletion layer | |
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| 4. | ![]() |
Capacitance- voltage and other characteristics of pn junctions | capacitance in abrupt junction, Poison's equation, breakdown mechanism, tunnel diodes | |
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Capacitance- voltage and other characteristics of pn junctions | capacitance in abrupt junction, Poison's equation, breakdown mechanism, tunnel diodes | |
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Capacitance- voltage and other characteristics of pn junctions | capacitance in abrupt junction, Poison's equation, breakdown mechanism, tunnel diodes | |
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Capacitance- voltage and other characteristics of pn junctions | capacitance in abrupt junction, Poison's equation, breakdown mechanism, tunnel diodes | |
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| 5. | ![]() |
Schottky diodes and fabrication of semiconductor devices | metal-semiconductor junction, thermionic emission, lithography, impurity doping | |
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Schottky diodes and fabrication of semiconductor devices | metal-semiconductor junction, thermionic emission, lithography, impurity doping | |
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Schottky diodes and fabrication of semiconductor devices | metal-semiconductor junction, thermionic emission, lithography, impurity doping | |
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Schottky diodes and fabrication of semiconductor devices | metal-semiconductor junction, thermionic emission, lithography, impurity doping | |
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| 6. | ![]() |
Operation principle of bipolar transistors Ⅰ | emitter, base, collector, current transmission efficiency | |
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Operation principle of bipolar transistors Ⅰ | emitter, base, collector, current transmission efficiency | |
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Operation principle of bipolar transistors Ⅰ | emitter, base, collector, current transmission efficiency | |
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Operation principle of bipolar transistors Ⅰ | emitter, base, collector, current transmission efficiency | |
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| 7. | ![]() |
Operation principle of bipolar transistors Ⅱ | current amplification factor, switching characteristics and bipolar integrated circuits | |
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Operation principle of bipolar transistors Ⅱ | current amplification factor, switching characteristics and bipolar integrated circuits | |
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Operation principle of bipolar transistors Ⅱ | current amplification factor, switching characteristics and bipolar integrated circuits | |
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Operation principle of bipolar transistors Ⅱ | current amplification factor, switching characteristics and bipolar integrated circuits | |
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| 8. | ![]() |
Operation principle of bipolar transistors Ⅲ | bipolar power devices, breakover characteristics, thyristor | |
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Operation principle of bipolar transistors Ⅲ | bipolar power devices, breakover characteristics, thyristor | |
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| 9. | ![]() |
Characteristics of MOS diodes Ⅰ | ideal MOS diodes, accumulation, depletion | |
| 10. | ![]() |
Characteritics of MOS diodes Ⅱ | inversion conditions, surface potential, threshold voltage, pulse response of MOS capacitance, deep depletion | |
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Characteritics of MOS diodes Ⅱ | inversion conditions, surface potential, threshold voltage, pulse response of MOS capacitance, deep depletion | |
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Characteritics of MOS diodes Ⅱ | inversion conditions, surface potential, threshold voltage, pulse response of MOS capacitance, deep depletion | |
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Characteritics of MOS diodes Ⅱ | inversion conditions, surface potential, threshold voltage, pulse response of MOS capacitance, deep depletion | |
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| 11. | ![]() |
Characreristics of MOSFETs | pinch-off, ID - VG and ID - VD characteristics, subthreshold characterisics | |
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Characreristics of MOSFETs | pinch-off, ID - VG and ID - VD characteristics, subthreshold characterisics | |
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Characreristics of MOSFETs | pinch-off, ID - VG and ID - VD characteristics, subthreshold characterisics | |
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| 12. | ![]() |
CMOS basic circuits | resistor-load inverter circuits, CMOS inverter circuits, NAND and NOR circuits | |
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CMOS basic circuits | resistor-load inverter circuits, CMOS inverter circuits, NAND and NOR circuits | |
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