반도체특성평가

반도체 재료 및 소자의 전기적 특성평가: 진보된 SOI 구조의 적용

Introduction: landscape and trends in microelectronics, importance of characterization (3 hours) 1

1.		Introduction: landscape and trends in microelectronics, importance of characterization (3 hours) 1
		Introduction: landscape and trends in microelectronics, importance of characterization (3 hours) 2
2.		Material characterization techniques (3 hours) 1
		Material characterization techniques (3 hours) 2
3.		Material characterization techniques (continued - 3 hours) 1
		Material characterization techniques (continued - 3 hours) 2
4.		Material characterization techniques (continued - 3 hours) 1
		Material characterization techniques (continued - 3 hours) 2
5.		Capacitor-based characterization techniques (3 hours) 1
		Capacitor-based characterization techniques (3 hours) 2
6.		Diode-based characterization techniques (3 hours) 1
		Diode-based characterization techniques (3 hours) 2
7.		Silicon on Insulator materials and devices (3 hours) 1
		Silicon on Insulator materials and devices (3 hours) 2
8.		MOSFET-based characterization techniques (3 hours) 1
		MOSFET-based characterization techniques (3 hours) 2
9.		MOSFET-based characterization techniques (continued - 3 hours) 1
		MOSFET-based characterization techniques (continued - 3 hours) 2
10.		MOSFET-based characterization techniques (continued - 3 hours) 1
		MOSFET-based characterization techniques (continued - 3 hours) 2
11.		Advanced effects in SOI MOSFETs and characterization (3 hours) 1
		Advanced effects in SOI MOSFETs and characterization (3 hours) 2
12.		Device reliability issues and related characterization (3 hours) 1