Reliability is a very valuable skill in any industry that focuses on product quality as key driver for profits. This course offers an introduction to the basics together with in-depth seminars on key reliability concerns for modern technologies from a material perspective. The first part looks into the main reliability models, failure mechanisms and yield, trying to link the basics with the defects and materials. Trap generation (i.e., failure) mechanisms for CMOS device and its impact on reliability projection will be discussed in details, together with some of the advanced techniques needed for these studies. The second part is seminar-like, with a broad overview of topics important for today’s fast-moving nanotechnology field. The choice of seminars is for both fundamental mechanisms (i.e., radiation effects) as well as more applicative (e.g., ESD).